TY - JOUR
T1 - High Electron Mobility and Ambient Stability in Solution-Processed Perylene-Based Organic Field-Effect Transistors
AU - Piliego, Claudia
AU - Jarzab, Dorota
AU - Gigli, Giuseppe
AU - Chen, Zhihua
AU - Facchetti, Antonio
AU - Loi, Maria Antonietta
PY - 2009/4/27
Y1 - 2009/4/27
N2 - The realization of bottom-contact bottom-gate organic field-effect transistors (OFETs) based on spin-coated films of N,N'-1H, 1H-perfluorobutyl dicyanoperylenecarboxydiimide (PDIF-CN2), was reported. These substrates were treated with both hexamethildisilazane (HMDS) and 3,5-bis(trifluoromethyl)thiophenol before semiconductor-layer deposition. The semiconductor film was spin-coated on the insulator/contact surface using a chloroform solution of PDIF-CN2. The devices were then annealed at 110°C in a vacuum oven for 60 min, and finally tested. In order to rationalize the electrical characteristic variations upon annealing, the semiconductor-film morphologies were investigated by atomic force microscopy (AFM) and confocal laser microscopy (CLM). The difference in the optical microscopy images of the PDIF-CN2 film and in the photoluminescence images obtained by CLM provides demonstration of the enhanced order of the annealed films. Good air stability is also observed, since the devices show stable mobility value after 20 days of continuous exposure to air.
AB - The realization of bottom-contact bottom-gate organic field-effect transistors (OFETs) based on spin-coated films of N,N'-1H, 1H-perfluorobutyl dicyanoperylenecarboxydiimide (PDIF-CN2), was reported. These substrates were treated with both hexamethildisilazane (HMDS) and 3,5-bis(trifluoromethyl)thiophenol before semiconductor-layer deposition. The semiconductor film was spin-coated on the insulator/contact surface using a chloroform solution of PDIF-CN2. The devices were then annealed at 110°C in a vacuum oven for 60 min, and finally tested. In order to rationalize the electrical characteristic variations upon annealing, the semiconductor-film morphologies were investigated by atomic force microscopy (AFM) and confocal laser microscopy (CLM). The difference in the optical microscopy images of the PDIF-CN2 film and in the photoluminescence images obtained by CLM provides demonstration of the enhanced order of the annealed films. Good air stability is also observed, since the devices show stable mobility value after 20 days of continuous exposure to air.
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U2 - 10.1002/adma.200803207
DO - 10.1002/adma.200803207
M3 - Article
AN - SCOPUS:66149112877
SN - 0935-9648
VL - 21
SP - 1573
EP - 1576
JO - Advanced Materials
JF - Advanced Materials
IS - 16
ER -