Abstract
We report a bias selectable dual-band mid-wave infrared (MWIR) and long-wave infrared (LWIR) co-located detector with 3 μm active region thickness per channel that is highly selective and can perform under high operating temperatures for the MWIR band. Under back-side illumination, a temperature evolution study of the MWIR detector's electro-optical performance found the 300 K background-limit with 2π field-of-view to be achieved below operating temperatures of 160 K, at which the temperature's 50% cutoff wavelength was 5.2 μm. The measured current reached the system limit of 0.1 pA at 110 K for 30 μm pixel-sized diodes. At 77 K, where the LWIR channel operated with a 50% cutoff wavelength at 11.2 μm, an LWIR selectivity of ∼17% was achieved in the MWIR wave band between 3 and 4.7 μm, making the detector highly selective.
Original language | English (US) |
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Title of host publication | Infrared Technology and Applications XXXIX |
Volume | 8704 |
DOIs | |
State | Published - Sep 17 2013 |
Event | 39th Infrared Technology and Applications - Baltimore, MD, United States Duration: Apr 29 2013 → May 3 2013 |
Other
Other | 39th Infrared Technology and Applications |
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Country/Territory | United States |
City | Baltimore, MD |
Period | 4/29/13 → 5/3/13 |
Keywords
- dual-band infrared imaging
- focal plane array
- high operating temperature infrared photodetector
- InAs/GaSb type-II superlattice
- infrared imaging
- longwavelength infrared
- mid-wavelength infrared
- photodetector
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering