High-performance computing based on spin-diode logic

Joseph S. Friedman, Bruce W. Wessels, Damien Querlioz, Alan V. Sahakian

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

The cascading of logic gates is one of the primary challenges for spintronic computing, as there is a need to dynamically create magnetic fields. Spin-diode logic provides this essential cascading, as the current through each spin-diode is modulated by a magnetic field created by the current through other spin-diodes. This logic family can potentially be applied to any device exhibiting strong positive or negative magnetoresistance, and allows for the creation of circuits with exceptionally high performance. These novel circuit structures provide an opportunity for spintronics to replace CMOS in general-purpose computing.

Original languageEnglish (US)
Title of host publicationSpintronics VII
EditorsHenri-Jean Drouhin, Jean-Eric Wegrowe, Manijeh Razeghi
PublisherSPIE
ISBN (Electronic)9781628411942
DOIs
StatePublished - Jan 1 2014
EventSpintronics VII - San Diego, United States
Duration: Aug 17 2014Aug 21 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9167
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherSpintronics VII
CountryUnited States
CitySan Diego
Period8/17/148/21/14

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Keywords

  • Beyond-CMOS
  • Emerging technology
  • Giant magnetoresistance
  • Next-generation computing
  • Spin-diode
  • Spin-diode logic
  • Spintronic logic
  • Spintronics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Friedman, J. S., Wessels, B. W., Querlioz, D., & Sahakian, A. V. (2014). High-performance computing based on spin-diode logic. In H-J. Drouhin, J-E. Wegrowe, & M. Razeghi (Eds.), Spintronics VII [91671J] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9167). SPIE. https://doi.org/10.1117/12.2062115