High-precision film thickness determination using a laser-based ultrasonic technique

Matthew J. Banet*, Martin Fuchs, John A. Rogers, James H. Reinold, Jeffrey M. Knecht, Mordechai Rothschild, Randy Logan, A. A. Maznev, Keith A. Nelson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

37 Scopus citations

Abstract

A noncontact and nondestructive laser-based acoustic technique called impulsive stimulated thermal scattering (ISTS) is used to measure thicknesses of metal films including Cu, Ta, W, Al, Ti, and others in single-layer and multilayer assemblies on silicon substrates. Other opaque film materials and substrates have also been examined. Thicknesses are determined with a repeatability of a few angstroms with data acquisition times of about 1 s. ISTS and conventional measurements (scanning electron microscopy, profilometry, and four-point electrical sheet resistance) are made on the same samples and the results are found to compare favorably.

Original languageEnglish (US)
Pages (from-to)169-171
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number2
DOIs
StatePublished - Dec 1 1998

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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