Keyphrases
A-Si
100%
Josephson
100%
Application-oriented
50%
Electron Microscopy Studies
50%
Interface Conditions
50%
High-resolution Transmission Electron Microscopy (HRTEM)
50%
Josephson Junction
50%
Multilayer Film
50%
Columnar Growth
50%
Magnetron Sputtering
50%
Columnar Grain Structure
50%
Flat Interface
50%
Layer Growth
50%
Rough Interface
50%
Amorphous Layer
50%
Sputtering Parameters
50%
Polycrystalline AlN
50%
Material Science
Multilayer Film
100%
Magnetron Sputtering
100%
Aluminum Nitride
100%
Josephson Junction
100%
Crystal Microstructure
100%
High-Resolution Transmission Electron Microscopy
100%
Physics
Polycrystalline
100%
Josephson Junction
100%
High Resolution
100%
Transmission Electron Microscopy
100%
Magnetron Sputtering
100%