High resolution electron microscopy of silver β- and β″ -aluminas

R. Hull*, AK Petford, CJ Humphreys, DJ Smith

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The structure and properties of silver β- and β″-aluminas have been investigated by high resolution electron microscopy at 200 and 500kV. Both materials exhibited the loss of silver-containing conduction planes under the influence of the electron beam, causing the structure to collapse and shear, forming broad defect spinel blocks. The structure of these defects in silver β″-alumina was investigated and a model for the atomic arrangement within the defects proposed. It was found that the electron beam caused extrusion of silver from both materials by two separate mechanisms; these mechanisms may shed light on the inter-granular resistivity in β-alumina type materials and on the formation and propagation of cracks. The structure of the conduction planes in silver β-alumina was also studied, and samples of sodium β″-alumina ion-exchanged to different extents with silver were investigated.

Original languageEnglish (US)
Pages (from-to)181-186
Number of pages6
JournalSolid State Ionics
Volume9-10
Issue numberPART 1
DOIs
StatePublished - Dec 1983

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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