High resolution electron microscopy of surfaces and surface reactions

David J. Smith; J. O. Bovin; L. A. Bursill; A. K. Petford‐Long; H. Q. Ye

doi:10.1002/sia.740100213

High resolution electron microscopy of surfaces and surface reactions

David J. Smith^*, J. O. Bovin, L. A. Bursill, A. K. Petford‐Long, H. Q. Ye

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

A 400 kV high‐resolution electron microscope has been used in the surface profile imaging mode to observe surfaces and surface reactions directly in real time. The processes studied include: the formation of surface oxides on Pd and Ag and on In‐compound semiconductors; surface reduction and metallization, diffusion and accretion on oxide surfaces; and structural rearrangements in small metal particles. It is concluded that the technique can provide unique information about surface phenomena.

Original language	English (US)
Pages (from-to)	135-141
Number of pages	7
Journal	Surface and Interface Analysis
Volume	10
Issue number	2-3
DOIs	https://doi.org/10.1002/sia.740100213
State	Published - Mar 1987

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

Access to Document

10.1002/sia.740100213

Cite this

@article{1f6092c1b0ef4b7a84233a18e4c6f5e1,

title = "High resolution electron microscopy of surfaces and surface reactions",

abstract = "A 400 kV high‐resolution electron microscope has been used in the surface profile imaging mode to observe surfaces and surface reactions directly in real time. The processes studied include: the formation of surface oxides on Pd and Ag and on In‐compound semiconductors; surface reduction and metallization, diffusion and accretion on oxide surfaces; and structural rearrangements in small metal particles. It is concluded that the technique can provide unique information about surface phenomena.",

author = "Smith, {David J.} and Bovin, {J. O.} and Bursill, {L. A.} and Petford‐Long, {A. K.} and Ye, {H. Q.}",

year = "1987",

month = mar,

doi = "10.1002/sia.740100213",

language = "English (US)",

volume = "10",

pages = "135--141",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

number = "2-3",

}

TY - JOUR

T1 - High resolution electron microscopy of surfaces and surface reactions

AU - Smith, David J.

AU - Bovin, J. O.

AU - Bursill, L. A.

AU - Petford‐Long, A. K.

AU - Ye, H. Q.

PY - 1987/3

Y1 - 1987/3

N2 - A 400 kV high‐resolution electron microscope has been used in the surface profile imaging mode to observe surfaces and surface reactions directly in real time. The processes studied include: the formation of surface oxides on Pd and Ag and on In‐compound semiconductors; surface reduction and metallization, diffusion and accretion on oxide surfaces; and structural rearrangements in small metal particles. It is concluded that the technique can provide unique information about surface phenomena.

AB - A 400 kV high‐resolution electron microscope has been used in the surface profile imaging mode to observe surfaces and surface reactions directly in real time. The processes studied include: the formation of surface oxides on Pd and Ag and on In‐compound semiconductors; surface reduction and metallization, diffusion and accretion on oxide surfaces; and structural rearrangements in small metal particles. It is concluded that the technique can provide unique information about surface phenomena.

UR - http://www.scopus.com/inward/record.url?scp=0022682481&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0022682481&partnerID=8YFLogxK

U2 - 10.1002/sia.740100213

DO - 10.1002/sia.740100213

M3 - Article

AN - SCOPUS:0022682481

SN - 0142-2421

VL - 10

SP - 135

EP - 141

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 2-3

ER -

High resolution electron microscopy of surfaces and surface reactions

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this