High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction

Susanna Hammarberg*, Vilgailė Dagytė, Lert Chayanun, Megan O. Hill, Alexander Wyke, Alexander Björling, Ulf Johansson, Sebastian Kalbfleisch, Magnus Heurlin, Lincoln J. Lauhon, Magnus T. Borgström, Jesper Wallentin

*Corresponding author for this work

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