A high-resolution subsurface microscopy technique, that significantly increases the numerical aperture without introducing spherical aberration was developed. The technique improves the diffraction-limited resolution beyond the limit of standard subsurface microscopy. It was found that by reducing the wavelength or increasing the collected solid angle, the spatial resolution of surface microscopy, was improved.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering