High resolution subsurface microscopy technique

Stephen Bradley Ippolito; Anna K. Swan; Bennett B. Goldberg; M. Selim Unlu

High resolution subsurface microscopy technique

Stephen Bradley Ippolito^*, Anna K. Swan, Bennett B. Goldberg, M. Selim Unlu

^*Corresponding author for this work

Physics and Astronomy

Research output: Contribution to journal › Conference article › peer-review

8 Scopus citations

Abstract

A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.

Original language	English (US)
Pages (from-to)	430-431
Number of pages	2
Journal	Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume	2
State	Published - Dec 1 2000

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Cite this

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title = "High resolution subsurface microscopy technique",

abstract = "A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.",

author = "{Bradley Ippolito}, Stephen and Swan, {Anna K.} and Goldberg, {Bennett B.} and {Selim Unlu}, M.",

year = "2000",

month = dec,

day = "1",

language = "English (US)",

volume = "2",

pages = "430--431",

journal = "Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS",

issn = "1092-8081",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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T1 - High resolution subsurface microscopy technique

AU - Bradley Ippolito, Stephen

AU - Swan, Anna K.

AU - Goldberg, Bennett B.

AU - Selim Unlu, M.

PY - 2000/12/1

Y1 - 2000/12/1

N2 - A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.

AB - A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.

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M3 - Conference article

AN - SCOPUS:0034476716

SN - 1092-8081

VL - 2

SP - 430

EP - 431

JO - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

JF - Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

ER -

High resolution subsurface microscopy technique

Abstract

ASJC Scopus subject areas

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