High resolution subsurface microscopy technique

Stephen Bradley Ippolito*, Anna K. Swan, Bennett B. Goldberg, M. Selim Unlu

*Corresponding author for this work

Research output: Contribution to journalConference article

7 Scopus citations

Abstract

A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.

Original languageEnglish (US)
Pages (from-to)430-431
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume2
StatePublished - Dec 1 2000

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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