A subsurface imaging technique that takes full advantage of the index of the sample to increase the Numerical Aperture (NA) is presented. The technique, referred to as the Numerical Aperture Increasing Lens (NAIL) is a lens that is placed on the surface of a sample. This technique is a significant improvement over standard optical microscopy for subsurface imaging at the diffraction limit.
|Original language||English (US)|
|Number of pages||2|
|Journal||Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS|
|State||Published - Dec 1 2000|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering