High resolution synchrotron X-ray diffraction tomography of large-grained samples

D. P. Piotrowski*, S. R. Stock, A. Guvenilir, J. D. Haase, Z. U. Rek

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


In order to understand the macroscopic response of polycrystalline structural materials to loading, it is frequently essential to know the spatial distribution of strain as well as the variation of micro-texture on the scale of 100 μm. The methods must be nondestructive, however, if the three-dimensional evolution of strain is to be studied. This paper describes an approach to high resolution synchrotron x-ray diffraction tomography of polycrystalline materials. Results from model samples of randomly-packed, millimeter-sized pieces of Si wafers and of similarly sized single-crystal Al blocks have been obtained which indicate that polychromatic beams collimated to 30 μm diameter can be used to determine the depth of diffracting volume elements within ±70 μm. The variation in the two-dimensional distribution of diffracted intensity with changing sample to detector separation is recorded on image storage plates and used to infer the depth of diffracting volume elements.

Original languageEnglish (US)
Pages (from-to)125-128
Number of pages4
JournalMaterials Research Society Symposium Proceedings
StatePublished - Dec 1 1996

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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