High resolution synchrotron x-ray diffraction tomography of polycrystalline samples

S. R. Stock*, A. Guvenilir, D. P. Piotrowski, Z. U. Rek

*Corresponding author for this work

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

The macroscopic response of polycrystalline materials to loading depends on both the spatial distribution of strain and the variation of microtexture on the scale of 100 μm. Nondestructive measurements are needed if the three-dimensional evolution of strain is to be studied. This paper describes approaches for high resolution synchrotron polychromatic x-ray diffraction tomography of polycrystalline materials. Preliminary experiments are reported on partially cracked compact tension samples of Al-Li 2090 and on model samples of randomly-packed, millimeter-sized pieces of Si wafers. Polychromatic beams collimated to 100 μm diameter have been used, and the distribution of diffracted intensity has been collected on high resolution x-ray film as well as on image storage plates. The depths of diffracting volume elements are determined from the changes in the spatial distribution of diffracted intensity with varying sample to detector separation.

Original languageEnglish (US)
Pages (from-to)275-280
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume375
StatePublished - Jan 1 1995
EventProceedings of the 1994 MRS Fall Meeting - Boston, MA, USA
Duration: Nov 28 1994Nov 30 1994

Fingerprint

Polycrystalline materials
Synchrotrons
Spatial distribution
Tomography
synchrotrons
x ray diffraction
tomography
Diffraction
X rays
high resolution
spatial distribution
Detectors
wafers
Experiments
detectors
x rays

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Stock, S. R. ; Guvenilir, A. ; Piotrowski, D. P. ; Rek, Z. U. / High resolution synchrotron x-ray diffraction tomography of polycrystalline samples. In: Materials Research Society Symposium - Proceedings. 1995 ; Vol. 375. pp. 275-280.
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High resolution synchrotron x-ray diffraction tomography of polycrystalline samples. / Stock, S. R.; Guvenilir, A.; Piotrowski, D. P.; Rek, Z. U.

In: Materials Research Society Symposium - Proceedings, Vol. 375, 01.01.1995, p. 275-280.

Research output: Contribution to journalConference article

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