High resolution transmission electron microscopy of interphase interfaces in NiO-ZrO2(CaO)

Vinayak P. Dravid*, C. E. Lyman, M. R. Notis, A. Revcolevschi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

High resolution transmission electron microscopy (HRTEM) observations of the interphase interfaces in the directionally solidified eutectic (DSE) NiO-ZrO2(CaO) are presented. The planar lamellar interfaces were observed to be extremely clean without any evidence of an interface phase. Characteristic line and/or step defects at the interface have been identified and analyzed. Chemical microanalysis using X-ray emission spectroscopy (XES) indicated clear partitioning of CaO to ZrO2. The observations are discussed in view of the limited understanding of the structure and chemistry of interphase interfaces in oxide systems.

Original languageEnglish (US)
Pages (from-to)60-70
Number of pages11
JournalUltramicroscopy
Volume29
Issue number1-4
DOIs
StatePublished - May 2 1989

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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