High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction

Tao Sun, Zixiao Pan, Sujing Xie, Zhonghou Cai, Jin Wang*, Vinayak P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe2 O4 nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.

Original languageEnglish (US)
Article number251914
JournalApplied Physics Letters
Volume98
Issue number25
DOIs
StatePublished - Jun 20 2011

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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