Abstract
The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe2 O4 nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.
Original language | English (US) |
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Article number | 251914 |
Journal | Applied Physics Letters |
Volume | 98 |
Issue number | 25 |
DOIs | |
State | Published - Jun 20 2011 |
Funding
This work and the use of the APS were supported by the U.S.-DOE-BES under Contract Nos. DE-AC02-06CH11357 and DE-F602-07ER46444. The AFM, SEM and TEM experiments were performed in the Keck II and EPIC facility of the NUANCE Center at Northwestern University. The NUANCE Center is supported by NSF-NSEC, NSF-MRSEC, the State of Illinois, and Northwestern University.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)