High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction

Tao Sun; Zixiao Pan; Sujing Xie; Zhonghou Cai; Jin Wang; Vinayak P. Dravid

doi:10.1063/1.3598443

High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction

Tao Sun, Zixiao Pan, Sujing Xie, Zhonghou Cai, Jin Wang^*, Vinayak P. Dravid

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe₂ O₄ nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.

Original language	English (US)
Article number	251914
Journal	Applied Physics Letters
Volume	98
Issue number	25
DOIs	https://doi.org/10.1063/1.3598443
State	Published - Jun 20 2011

Funding

This work and the use of the APS were supported by the U.S.-DOE-BES under Contract Nos. DE-AC02-06CH11357 and DE-F602-07ER46444. The AFM, SEM and TEM experiments were performed in the Keck II and EPIC facility of the NUANCE Center at Northwestern University. The NUANCE Center is supported by NSF-NSEC, NSF-MRSEC, the State of Illinois, and Northwestern University.

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction",

abstract = "The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe2 O4 nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.",

author = "Tao Sun and Zixiao Pan and Sujing Xie and Zhonghou Cai and Jin Wang and Dravid, {Vinayak P.}",

note = "Funding Information: This work and the use of the APS were supported by the U.S.-DOE-BES under Contract Nos. DE-AC02-06CH11357 and DE-F602-07ER46444. The AFM, SEM and TEM experiments were performed in the Keck II and EPIC facility of the NUANCE Center at Northwestern University. The NUANCE Center is supported by NSF-NSEC, NSF-MRSEC, the State of Illinois, and Northwestern University. Copyright: Copyright 2011 Elsevier B.V., All rights reserved.",

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AU - Cai, Zhonghou

AU - Wang, Jin

AU - Dravid, Vinayak P.

N1 - Funding Information: This work and the use of the APS were supported by the U.S.-DOE-BES under Contract Nos. DE-AC02-06CH11357 and DE-F602-07ER46444. The AFM, SEM and TEM experiments were performed in the Keck II and EPIC facility of the NUANCE Center at Northwestern University. The NUANCE Center is supported by NSF-NSEC, NSF-MRSEC, the State of Illinois, and Northwestern University. Copyright: Copyright 2011 Elsevier B.V., All rights reserved.

PY - 2011/6/20

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N2 - The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe2 O4 nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.

AB - The generation and presence of strain around nanostructures of oxides is a key to their growth, properties, and functions, but it has been a challenge to experimentally measure its sign, magnitude, and spatial distribution. Combining diffuse scattering with scanning x-ray nanodiffraction, we have mapped the strain distribution in an oxide-on-oxide nanopatterned structure with a high sensitivity (10-4) and a submicrometer spatial resolution. An edge-induced strain distribution is observed from a sample of CoFe2 O4 nanolines epitaxially grown on MgO substrate, which agrees quantitatively with the numerical simulations.

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High-sensitivity strain mapping around epitaxial oxide nanostructures using scanning x-ray nanodiffraction

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