TY - GEN
T1 - High-speed nearfield optical recording using plasmonic flying head
AU - Pan, Liang
AU - Park, Yong Shik
AU - Ulin-Avila, Erick
AU - Xiong, Yi
AU - Zeng, Li
AU - Sun, Cheng
AU - Bogy, David B.
AU - Zhang, Xiang
PY - 2011
Y1 - 2011
N2 - Optical lithography has been the critical process for continuous size reduction of semiconductor devices and circuits manufacturing1, 2. As the industry is continually improving the lithography feature size, conventional optical lithography becomes more difficult and costive in satisfying the ever increasing demands in nano-manufacturing because of the fundamental limit of diffraction. Many maskless processes are capable of creating feature sizes better than optical lithography, but they all suffer from their low throughput. Here we experimentally demonstrated the capability of parallel patterning with 50 nm linewidth with a high flying speed at 10 meter/second. This is a low-cost high-throughput nano-fabrication scheme which has the potential of a few orders of magnitude higher throughput than current maskless techniques. It promises a new route towards the next generation nano-manufacturing. Besides its application in nanolithography, this technique can also be used for nanoscale metrology, imaging and data storage.
AB - Optical lithography has been the critical process for continuous size reduction of semiconductor devices and circuits manufacturing1, 2. As the industry is continually improving the lithography feature size, conventional optical lithography becomes more difficult and costive in satisfying the ever increasing demands in nano-manufacturing because of the fundamental limit of diffraction. Many maskless processes are capable of creating feature sizes better than optical lithography, but they all suffer from their low throughput. Here we experimentally demonstrated the capability of parallel patterning with 50 nm linewidth with a high flying speed at 10 meter/second. This is a low-cost high-throughput nano-fabrication scheme which has the potential of a few orders of magnitude higher throughput than current maskless techniques. It promises a new route towards the next generation nano-manufacturing. Besides its application in nanolithography, this technique can also be used for nanoscale metrology, imaging and data storage.
UR - http://www.scopus.com/inward/record.url?scp=85087596149&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85087596149&partnerID=8YFLogxK
U2 - 10.1364/isom_ods.2011.oma3
DO - 10.1364/isom_ods.2011.oma3
M3 - Conference contribution
AN - SCOPUS:85087596149
SN - 9781557529152
T3 - Optics InfoBase Conference Papers
BT - Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
PB - Optical Society of America (OSA)
T2 - Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
Y2 - 17 July 2011 through 20 July 2011
ER -