INIS
electrical properties
66%
data
50%
oxygen
50%
perovskite
50%
thermal gravimetric analysis
33%
defects
33%
sheets
33%
high temperature
33%
perovskites
33%
transmission electron microscopy
16%
resolution
16%
x-ray diffraction
16%
oxides
16%
transport
16%
carriers
16%
rare earths
16%
concentration
16%
doped materials
16%
superconductors
16%
copper
16%
vanadium oxides
16%
titanium
16%
partial pressure
16%
yttrium compounds
16%
vacancies
16%
electrical conductivity
16%
bond lengths
16%
cuprates
16%
Physics
Perovskites
83%
Electrical Properties
66%
Defects
33%
High Temperature
33%
Sites
33%
Oxygen
33%
Transmission Electron Microscopy
16%
High Resolution
16%
Oxide
16%
Intercalation
16%
Cuprates
16%
Model
16%
Light
16%
Plane
16%
Copper
16%
Titanium
16%
Chemistry
Electrical Property
66%
X-Ray Diffraction
50%
Dioxygen
33%
Bond Length
16%
Lanthanoid Atom
16%
Oxide
16%
Superconductor
16%
Partial Pressure
16%
Transport Phenomena
16%
Analytical Method
16%
Structure
16%
Doping
16%
Amount
16%
Material Science
Thermogravimetric Analysis
100%
Oxygen Vacancy
66%
Defect
33%
Carrier Concentration
16%
Superconducting Material
16%
Material
16%
Electrical Conductivity
16%
Biochemistry, Genetics and Molecular Biology
Perovskite
83%
High Temperature
33%
X Ray Diffraction
16%
Electric Conductivity
16%
Oxygen Tension
16%
Light
16%
Transmission Electron Microscopy
16%
Length
16%
Copper
16%