High temporal & spatial resolution imaging of catastrophic & soft breakdown in self-assembled nanodielectrics (SANDs) films

Amr Mohammed, Kerry Maize, Katie Stallings, Tobin Marks, David Clarke, Peter Bermel, Muhammad Alam, Ali Shakouri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Breakdown processes in polymer dielectrics pose a limitation to energy storage and high-power operation of many electronic devices. These processes have been studied for many decades, and a great deal of progress has been made in developing phenomenological models [1]. Nonetheless, many open questions remain, particularly regarding the development of a single, unified theory to describe all stages of the breakdown process, from initiation, to sub-critical filament advance, to catastrophic breakdown and/or 'soft breakdown' [2]. To develop and validate such a detailed understanding, it is essential to first develop high-speed, spatially-resolved in situ characterization techniques. Here we demonstrate that thermoreflectance imaging [3-5] can provide such a capability for voltage stress-induced defects in self-assembled polymer nanodielectrics (SANDs) films [6]. Temporal evolution of self-heating and material blister formation for soft and catastrophic failure sites in SANDs films are imaged at submicron spatial resolution. This result shows that thermoreflectance characterization techniques provide insight into the breakdown processes determining polymer dielectric performance and reliability.

Original languageEnglish (US)
Title of host publication75th Annual Device Research Conference, DRC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509063277
DOIs
StatePublished - Aug 1 2017
Event75th Annual Device Research Conference, DRC 2017 - South Bend, United States
Duration: Jun 25 2017Jun 28 2017

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other75th Annual Device Research Conference, DRC 2017
CountryUnited States
CitySouth Bend
Period6/25/176/28/17

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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