Abstract
Electron microscopy (EM) represents the most powerful tool to directly characterize the structure of individual nanoparticles. Accurate descriptions of nanoparticle populations with EM, however, are currently limited by the lack of tools to quantitatively analyze populations in a high-throughput manner. Herein, we report a computational method to algorithmically analyze EM images that allows for the first automated structural quantification of heterogeneous nanostructure populations, with species that differ in both size and shape. This allows one to accurately describe nanoscale structure at the bulk level, analogous to ensemble measurements with individual particle resolution. With our described EM protocol and our inclusion of freely available code for our algorithmic analysis, we aim to standardize EM characterization of nanostructure populations to increase reproducibility, objectivity, and throughput in measurements. We believe this work will have significant implications in diverse research areas involving nanomaterials, including, but not limited to, fundamental studies of structural control in nanoparticle synthesis, nanomaterial-based therapeutics and diagnostics, optoelectronics, and catalysis.
Original language | English (US) |
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Pages (from-to) | 12488-12495 |
Number of pages | 8 |
Journal | ACS nano |
Volume | 9 |
Issue number | 12 |
DOIs | |
State | Published - Nov 20 2015 |
Funding
This material is based upon work supported by the AFOSR awards FA9550-12-1-0280, FA9550-11-1-0275, and FA9550-12-1-0141. C.R.L. and M.N.O. are grateful to the NSF for a Graduate Research Fellowship. K.A.B. gratefully acknowledges support from Northwestern University''s International Institute for Nanotechnology. This work made use of the EPIC facility (NUANCE Center Northwestern University), which has received support from the MRSEC program (NSF DMR-1121262) at the Materials Research Center; the International Institute for Nanotechnology (IIN); and the State of Illinois, through the IIN.
Keywords
- automated
- electron microscopy
- high-throughput
- image analysis
- nanoparticles
ASJC Scopus subject areas
- General Engineering
- General Materials Science
- General Physics and Astronomy