HREM study of Co/Cu/Co/MnFe spin valves

Pascale Bayle-Guillemaud*, Amanda K. Petford-Long, Thomas C. Anthony, James A. Brug

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

High resolution electron microscopy (HREM) has been used to investigate the structure of Co(6nm)/Cu(2.8nm)/Co(4nm)/MnFe(12nm) spin valves so as to correlate the structure with the magnetic properties. The presence of a Ti seed layer enhances the structural quality of the film giving a strong 〈111〉 texture and large grain size. It is shown that the 〈111〉 texture favours a high exchange bias field. A numerical analysis of the HREM micrographs has been carried out in order to investigate more quantitatively the structure of the interfaces. It has been shown that locally they are diffuse over 2 monolayers in the growth direction.

Original languageEnglish (US)
Pages (from-to)4627-4629
Number of pages3
JournalIEEE Transactions on Magnetics
Volume32
Issue number5 PART 2
DOIs
StatePublished - 1996

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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