This paper briefly discusses localisation in high-resolution electron microscope images, i.e. the extent to which one can consider the images as faithful representations of the individual atomic columns. Firstly we indicate how the tightly bound nature of the Bloch waves at a zone axis automatically generates diffractive localisation. We then deal with the imaging, the main source of delocalising effects. By using a pseudo-Wannier analysis, we indicate how a localisation function can be defined and also how the different microscope aberrations can partially cancel to produce localised images.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics