Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope

J. S. Wu; A. M. Kim; R. Bleher; B. D. Myers; R. G. Marvin; H. Inada; K. Nakamura; X. F. Zhang; E. Roth; S. Y. Li; T. K. Woodruff; T. V. O'Halloran; Vinayak P. Dravid

doi:10.1016/j.ultramic.2013.01.004

Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope

J. S. Wu^*, A. M. Kim, R. Bleher, B. D. Myers, R. G. Marvin, H. Inada, K. Nakamura, X. F. Zhang, E. Roth, S. Y. Li, T. K. Woodruff, T. V. O'Halloran, Vinayak P. Dravid

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems.

Original language	English (US)
Pages (from-to)	24-31
Number of pages	8
Journal	Ultramicroscopy
Volume	128
DOIs	https://doi.org/10.1016/j.ultramic.2013.01.004
State	Published - May 1 2013

Keywords

Cryo-transmission electron microscopy
Scanning transmission electron microscopy
X-ray EDS analysis

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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Wu, J. S., Kim, A. M., Bleher, R., Myers, B. D., Marvin, R. G., Inada, H., Nakamura, K., Zhang, X. F., Roth, E., Li, S. Y., Woodruff, T. K., O'Halloran, T. V., & Dravid, V. P. (2013). Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope. Ultramicroscopy, 128, 24-31. https://doi.org/10.1016/j.ultramic.2013.01.004

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abstract = "A dedicated analytical scanning transmission electron microscope (STEM) with dual energy dispersive spectroscopy (EDS) detectors has been designed for complementary high performance imaging as well as high sensitivity elemental analysis and mapping of biological structures. The performance of this new design, based on a Hitachi HD-2300A model, was evaluated using a variety of biological specimens. With three imaging detectors, both the surface and internal structure of cells can be examined simultaneously. The whole-cell elemental mapping, especially of heavier metal species that have low cross-section for electron energy loss spectroscopy (EELS), can be faithfully obtained. Optimization of STEM imaging conditions is applied to thick sections as well as thin sections of biological cells under low-dose conditions at room and cryogenic temperatures. Such multimodal capabilities applied to soft/biological structures usher a new era for analytical studies in biological systems.",

keywords = "Cryo-transmission electron microscopy, Scanning transmission electron microscopy, X-ray EDS analysis",

author = "Wu, {J. S.} and Kim, {A. M.} and R. Bleher and Myers, {B. D.} and Marvin, {R. G.} and H. Inada and K. Nakamura and Zhang, {X. F.} and E. Roth and Li, {S. Y.} and Woodruff, {T. K.} and O'Halloran, {T. V.} and Dravid, {Vinayak P.}",

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Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope. / Wu, J. S.; Kim, A. M.; Bleher, R.; Myers, B. D.; Marvin, R. G.; Inada, H.; Nakamura, K.; Zhang, X. F.; Roth, E.; Li, S. Y.; Woodruff, T. K.; O'Halloran, T. V.; Dravid, Vinayak P.

In: Ultramicroscopy, Vol. 128, 01.05.2013, p. 24-31.

Research output: Contribution to journal › Article › peer-review

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AU - Zhang, X. F.

AU - Roth, E.

AU - Li, S. Y.

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