Imaging of micro- and nano-structures with hard X-rays

C. Rau; V. Crecea; C. P. Richter; K. M. Peterson; P. R. Jemian; U. Neuhäusler; G. Schneider; X. Yu; P. V. Braun; T. C. Chiang; I. K. Robinson

doi:10.1049/mnl:20065060

Imaging of micro- and nano-structures with hard X-rays

C. Rau^*, V. Crecea, C. P. Richter, K. M. Peterson, P. R. Jemian, U. Neuhäusler, G. Schneider, X. Yu, P. V. Braun, T. C. Chiang, I. K. Robinson

^*Corresponding author for this work

Otolaryngology

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

Original language	English (US)
Pages (from-to)	1-5
Number of pages	5
Journal	Micro and Nano Letters
Volume	2
Issue number	1
DOIs	https://doi.org/10.1049/mnl:20065060
State	Published - 2007

ASJC Scopus subject areas

Bioengineering
Biomedical Engineering
General Materials Science
Condensed Matter Physics

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abstract = "Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.",

author = "C. Rau and V. Crecea and Richter, {C. P.} and Peterson, {K. M.} and Jemian, {P. R.} and U. Neuh{\"a}usler and G. Schneider and X. Yu and Braun, {P. V.} and Chiang, {T. C.} and Robinson, {I. K.}",

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AU - Rau, C.

AU - Crecea, V.

AU - Richter, C. P.

AU - Peterson, K. M.

AU - Jemian, P. R.

AU - Neuhäusler, U.

AU - Schneider, G.

AU - Yu, X.

AU - Braun, P. V.

AU - Chiang, T. C.

AU - Robinson, I. K.

PY - 2007

Y1 - 2007

N2 - Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

AB - Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

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Imaging of micro- and nano-structures with hard X-rays

Abstract

ASJC Scopus subject areas

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