Imaging of micro- and nano-structures with hard X-rays

C. Rau*, V. Crecea, C. P. Richter, K. M. Peterson, P. R. Jemian, U. Neuhäusler, G. Schneider, X. Yu, P. V. Braun, T. C. Chiang, I. K. Robinson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built. These complementary techniques cover a large range of length-scales.

Original languageEnglish (US)
Pages (from-to)1-5
Number of pages5
JournalMicro and Nano Letters
Volume2
Issue number1
DOIs
StatePublished - 2007

ASJC Scopus subject areas

  • Bioengineering
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

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