Abstract
We report success in applying direct phasing methods to produce images of surface structures at the atomic scale from intensity data collected using transmission electron diffraction.
Original language | English (US) |
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Pages (from-to) | 1-8 |
Number of pages | 8 |
Journal | Surface Review and Letters |
Volume | 4 |
Issue number | 1 |
DOIs | |
State | Published - Feb 1997 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry