Imaging the Dimers in Si\(111\)-\(7 × 7\)

E. Bengu, R. Plass, L. D. Marks, T. Ichihashi, P. M. Ajayan, S. Iijima

Research output: Contribution to journalArticlepeer-review

41 Scopus citations


High resolution electron microscope images of the Si\(111\)-\(7 × 7\) surface in the plan-view geometry have been analyzed, and the overlap of the top and bottom surfaces has been extracted numerically. The resultant images show clearly not just the adatoms seen by scanning tunneling microscopy but all the atoms in the top three layers, including the dimers in the third layer.

Original languageEnglish (US)
Pages (from-to)4226-4228
Number of pages3
JournalPhysical review letters
Issue number20
StatePublished - 1996

ASJC Scopus subject areas

  • General Physics and Astronomy


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