Improved imaging of soft materials with modified AFM tips

Richard D. Piner, Seunghun Hong, Chad A. Mirkin

Research output: Contribution to journalArticlepeer-review

39 Scopus citations


Herein, we report a simple method for making silicon nitride tips hydrophobic without significantly changing their shape. Specifically, we show that atomic force microscope (AFM) tips coated with physisorbed multilayers of 1-dodecylamine, when used in air, offer enhanced resolution for both organic and inorganic materials. The reason for this is due to a significant reduction in the capillary effect associated with water condensation between the tip and substrate.

Original languageEnglish (US)
Pages (from-to)5457-5460
Number of pages4
Issue number17
StatePublished - Aug 17 1999

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

Fingerprint Dive into the research topics of 'Improved imaging of soft materials with modified AFM tips'. Together they form a unique fingerprint.

Cite this