Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects

Alex Polizzotti*, Alireza Faghaninia, Jeremy R. Poindexter, Lea Nienhaus, Vera Steinmann, Robert L.Z. Hoye, Alexandre Felten, Amjad Deyine, Niall M. Mangan, Juan Pablo Correa-Baena, Seong Sik Shin, Shaffiq Jaffer, Moungi G. Bawendi, Cynthia Lo, Tonio Buonassisi

*Corresponding author for this work

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Physics

Material Science