In situ electron microscopy four-point electromechanical characterization of freestanding metallic and semiconducting nanowires

Rodrigo A. Bernal, Tobin Filleter, Justin G. Connell, Kwonnam Sohn, Jiaxing Huang, Lincoln J. Lauhon, Horacio D. Espinosa*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Fingerprint

Dive into the research topics of 'In situ electron microscopy four-point electromechanical characterization of freestanding metallic and semiconducting nanowires'. Together they form a unique fingerprint.

Engineering & Materials Science

Medicine & Life Sciences

Chemical Compounds