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In situ electron microscopy four-point electromechanical characterization of freestanding metallic and semiconducting nanowires
Rodrigo A. Bernal, Tobin Filleter, Justin G. Connell, Kwonnam Sohn, Jiaxing Huang, Lincoln J. Lauhon, Horacio D. Espinosa*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
35
Scopus
citations