In-Situ electron microscopy testing of 1-d nanostructures

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Over the past decade, there has been a substantial thrust to reduce the size of electronic and electromechanical systems to the nano scale by fabricating devices out of thin films, carbon nanotubes (CNTs) and nanowires (NWs). In these applications, a thorough understanding of material mechanical, electrical and thermal properties as well as device performance and reliability requires the development of novel experimental approaches. In this presentation the design, microfabrication and operation of a MEMS based nanoscale material testing system (n-MTS, see Fig. 1) will be presented. Results obtained from in-situ SEM and TEM tensile testing of NWs and CNTs will be discussed. We will show that TEM imaging is required to properly assess the modulus and strength of multi-walled CNTs (MWCNTs) and demonstrate that the assumption of outer shell failure is not accurate in most cases. We will also discuss a change in failure mode as a function of electron and ion radiation.

Original languageEnglish (US)
Title of host publication2008 Proceedings of the 9th Biennial Conference on Engineering Systems Design and Analysis
Pages551-552
Number of pages2
Volume1
StatePublished - Sep 21 2009
Event2008 9th Biennial Conference on Engineering Systems Design and Analysis - Haifa, Israel
Duration: Jul 7 2008Jul 9 2008

Other

Other2008 9th Biennial Conference on Engineering Systems Design and Analysis
CountryIsrael
CityHaifa
Period7/7/087/9/08

ASJC Scopus subject areas

  • Computational Mechanics
  • Control and Systems Engineering
  • Mechanical Engineering

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