In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices

Tony Jun Huang; A. Flood; Chih Wei Chu; Seogshin Kang; Tzung Fang Guo; T. Yamamoto; Hsian Rong Tseng; Bi Dan Yu; Yang Yang; J. F. Stoddart; Chih Ming Ho

doi:10.1109/NANO.2003.1231008

In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices

Tony Jun Huang, A. Flood, Chih Wei Chu, Seogshin Kang, Tzung Fang Guo, T. Yamamoto, Hsian Rong Tseng, Bi Dan Yu, Yang Yang, J. F. Stoddart, Chih Ming Ho

Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Scopus citations

Abstract

An in situ Fourier-transform infrared (FTIR) spectroscopic technique has been developed to monitor molecular behavior in single-molecule thick nanoelectronic devices. This approach is applicable to a range of molecular-based devices and has the potential to provide researchers in the field with a tool to understand the molecular behavior that contributes to device performance.

Original language	English (US)
Title of host publication	2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings
Publisher	IEEE Computer Society
Pages	698-701
Number of pages	4
ISBN (Electronic)	0780379764
DOIs	https://doi.org/10.1109/NANO.2003.1231008
State	Published - 2003
Event	2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - San Francisco, United States Duration: Aug 12 2003 → Aug 14 2003

Publication series

Name	Proceedings of the IEEE Conference on Nanotechnology
Volume	2
ISSN (Print)	1944-9399
ISSN (Electronic)	1944-9380

Other

Other	2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003
Country	United States
City	San Francisco
Period	8/12/03 → 8/14/03

Keywords

Aerospace engineering
Biochemistry
CMOS technology
Design optimization
Infrared spectra
Materials science and technology
Molecular electronics
Monitoring
Nanoscale devices
Spectroscopy

ASJC Scopus subject areas

Bioengineering
Electrical and Electronic Engineering
Materials Chemistry
Condensed Matter Physics

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10.1109/NANO.2003.1231008

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Huang, T. J., Flood, A., Chu, C. W., Kang, S., Guo, T. F., Yamamoto, T., Tseng, H. R., Yu, B. D., Yang, Y., Stoddart, J. F., & Ho, C. M. (2003). In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices. In 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings (pp. 698-701). [1231008] (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2). IEEE Computer Society. https://doi.org/10.1109/NANO.2003.1231008

Huang, Tony Jun ; Flood, A. ; Chu, Chih Wei ; Kang, Seogshin ; Guo, Tzung Fang ; Yamamoto, T. ; Tseng, Hsian Rong ; Yu, Bi Dan ; Yang, Yang ; Stoddart, J. F. ; Ho, Chih Ming. / In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices. 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society, 2003. pp. 698-701 (Proceedings of the IEEE Conference on Nanotechnology).

@inproceedings{afd5e48fe55741bd9c51d7028c09fe25,

title = "In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices",

abstract = "An in situ Fourier-transform infrared (FTIR) spectroscopic technique has been developed to monitor molecular behavior in single-molecule thick nanoelectronic devices. This approach is applicable to a range of molecular-based devices and has the potential to provide researchers in the field with a tool to understand the molecular behavior that contributes to device performance.",

keywords = "Aerospace engineering, Biochemistry, CMOS technology, Design optimization, Infrared spectra, Materials science and technology, Molecular electronics, Monitoring, Nanoscale devices, Spectroscopy",

author = "Huang, {Tony Jun} and A. Flood and Chu, {Chih Wei} and Seogshin Kang and Guo, {Tzung Fang} and T. Yamamoto and Tseng, {Hsian Rong} and Yu, {Bi Dan} and Yang Yang and Stoddart, {J. F.} and Ho, {Chih Ming}",

note = "Publisher Copyright: {\textcopyright} 2003 IEEE. Copyright: Copyright 2015 Elsevier B.V., All rights reserved.; 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 ; Conference date: 12-08-2003 Through 14-08-2003",

year = "2003",

doi = "10.1109/NANO.2003.1231008",

language = "English (US)",

series = "Proceedings of the IEEE Conference on Nanotechnology",

publisher = "IEEE Computer Society",

pages = "698--701",

booktitle = "2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings",

address = "United States",

}

Huang, TJ, Flood, A, Chu, CW, Kang, S, Guo, TF, Yamamoto, T, Tseng, HR, Yu, BD, Yang, Y, Stoddart, JF & Ho, CM 2003, In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices. in 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings., 1231008, Proceedings of the IEEE Conference on Nanotechnology, vol. 2, IEEE Computer Society, pp. 698-701, 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003, San Francisco, United States, 8/12/03. https://doi.org/10.1109/NANO.2003.1231008

In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices. / Huang, Tony Jun; Flood, A.; Chu, Chih Wei; Kang, Seogshin; Guo, Tzung Fang; Yamamoto, T.; Tseng, Hsian Rong; Yu, Bi Dan; Yang, Yang; Stoddart, J. F.; Ho, Chih Ming.

2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society, 2003. p. 698-701 1231008 (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices

AU - Huang, Tony Jun

AU - Flood, A.

AU - Chu, Chih Wei

AU - Kang, Seogshin

AU - Guo, Tzung Fang

AU - Yamamoto, T.

AU - Tseng, Hsian Rong

AU - Yu, Bi Dan

AU - Yang, Yang

AU - Stoddart, J. F.

AU - Ho, Chih Ming

PY - 2003

Y1 - 2003

N2 - An in situ Fourier-transform infrared (FTIR) spectroscopic technique has been developed to monitor molecular behavior in single-molecule thick nanoelectronic devices. This approach is applicable to a range of molecular-based devices and has the potential to provide researchers in the field with a tool to understand the molecular behavior that contributes to device performance.

AB - An in situ Fourier-transform infrared (FTIR) spectroscopic technique has been developed to monitor molecular behavior in single-molecule thick nanoelectronic devices. This approach is applicable to a range of molecular-based devices and has the potential to provide researchers in the field with a tool to understand the molecular behavior that contributes to device performance.

KW - Aerospace engineering

KW - Biochemistry

KW - CMOS technology

KW - Design optimization

KW - Infrared spectra

KW - Materials science and technology

KW - Molecular electronics

KW - Monitoring

KW - Nanoscale devices

KW - Spectroscopy

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DO - 10.1109/NANO.2003.1231008

M3 - Conference contribution

AN - SCOPUS:33746421866

T3 - Proceedings of the IEEE Conference on Nanotechnology

SP - 698

EP - 701

BT - 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings

PB - IEEE Computer Society

T2 - 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003

Y2 - 12 August 2003 through 14 August 2003

ER -

Huang TJ, Flood A, Chu CW, Kang S, Guo TF, Yamamoto T et al. In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices. In 2003 3rd IEEE Conference on Nanotechnology, IEEE-NANO 2003 - Proceedings. IEEE Computer Society. 2003. p. 698-701. 1231008. (Proceedings of the IEEE Conference on Nanotechnology). https://doi.org/10.1109/NANO.2003.1231008

In situ infrared spectroscopic studies of molecular behavior in nanoelectronic devices

Abstract

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Keywords

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