In situ TEM studies of local transport and structure in nanoscale multilayer films

A. N. Chiaramonti*, L. J. Thompson, W. F. Egelhoff, B. C. Kabius, A. K. Petford-Long

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

This paper describes a novel technique for studying structure-transport correlations in nanoscale multilayer thin films. Here, local current-voltage characteristics from simplified magnetic tunnel junctions are measured in situ on cross-sectional transmission electron microscopy (TEM) samples and correlated directly with TEM images of the microstructure at the tunneling site. It is found that local variations in barrier properties can be detected by a point probe method, and that the tunneling barrier height and width can be extracted.

Original languageEnglish (US)
Pages (from-to)1529-1535
Number of pages7
JournalUltramicroscopy
Volume108
Issue number12
DOIs
StatePublished - Nov 1 2008

Keywords

  • In situ
  • Microscopic methods for solid interfaces and multilayers
  • Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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