InAs quantum dot infrared photodetectors (QDIP) on InP by MOCVD

Wei Zhang*, Hochul Lim, Stanley Tsao, Kan Mi, Bijan Movaghar, Thomas Sills, Jutao Jiang, Manijeh Razeghi

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

Inter-subband detectors such as quantum well infrared photodetectors (QWIP) have been widely used in infrared remote sensing. Quantum dot infrared photodetectors (QDIPs) have been predicted to have better performance than QWIPs due to the novel properties of quantum dots caused by the extra confinement. Here we report our recent results of InAs QDIP grown on InP substrate by low-pressure metalorganic chemical vapor deposition. The device structure consists of multiple stacks of InAs quantum dots with GaAs/AlInAs/InP barrier. 400μm×400μm test mesas were fabricated for device characterizations. Photoresponse was observed with a peak wavelength of 6.4 μm and a cutoff wavelength of 6.6 μm at both 77K and 100K. A detectivity of 1.0×10 10cmHz 1/2/W was obtained at 77K at a bias of-1.1 V. To the best of our knowledge, this is the highest detectivity reported for InAs QDIP grown on InP substrate. At 100K, the detectivity only drops to 2.3×10 9cmHz 1/2/W.

Original languageEnglish (US)
Article number04
Pages (from-to)22-30
Number of pages9
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5543
DOIs
StatePublished - 2004
EventInfrared Spaceborne Remote Sensing XII - Denver, CO, United States
Duration: Aug 2 2004Aug 3 2004

Keywords

  • Detector
  • Inas
  • Infrared
  • Inp
  • MOCVD
  • Quantum dot

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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