Abstract
While thin film transmission spectroscopy systems can measure semiconductor optical properties, the utilized optimization-based evaluation methods often introduce variances in the results. We introduce a method of optimizing film surface shapes that reduces this uncertainty.
| Original language | English (US) |
|---|---|
| State | Published - 2024 |
| Event | 2024 Frontiers in Optics, FiO 2024 - Denver, United States Duration: Sep 23 2024 → Sep 26 2024 |
Conference
| Conference | 2024 Frontiers in Optics, FiO 2024 |
|---|---|
| Country/Territory | United States |
| City | Denver |
| Period | 9/23/24 → 9/26/24 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Electronic, Optical and Magnetic Materials
- Instrumentation
- General Computer Science
- Space and Planetary Science
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics