Information storage materials: Nanoscale characterisation by three-dimensional atom probe analysis

D. J. Larson*, A. K. Petford-Long, Y. Q. Ma, A. Cerezo

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

73 Scopus citations

Abstract

The development of nanoscale magnetic materials for applications in information storage systems relies heavily on the ability to engineer the properties of the layered structures from which such materials are fabricated. These properties are strongly dependent on the nature of the interfaces between the individual nanoscale magnetic layers, so knowledge of the interface chemistry is crucial. In this paper, we discuss the application of three-dimensional atom probe analysis to the characterisation of layered magnetic materials, including details of specimen preparation techniques required for this type of analysis. Recent results are presented on the characterisation of interfaces in Co/Cu or CoFe/Cu multilayers, which form part of the read sensor in magnetic recording heads, and Co/Pd multilayers, which are being considered for use as perpendicular recording media.

Original languageEnglish (US)
Pages (from-to)2847-2862
Number of pages16
JournalActa Materialia
Volume52
Issue number10
DOIs
StatePublished - Jun 7 2004

Keywords

  • Atom probe
  • Layered structures
  • Magnetic thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

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