Inherent carbonaceous impurities on arc-discharge multiwalled carbon nanotubes and their implications for nanoscale interfaces

Zhi An, Al'ona Furmanchuk, Rajaprakash Ramachandramoorthy, Tobin Filleter, Michael R. Roenbeck, Horacio D. Espinosa*, George C. Schatz, Son Binh T. Nguyen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

This paper presents evidence that strongly adhered carbonaceous surface impurities, intrinsic impurities that accompany multiwall carbon nanotubes (MWCNTs) synthesized by arc-discharge, are a component that cannot be ignored in experiments involving single nanotubes and their interfaces with a second surface. At the interface that forms between a carbon nanotube and a graphitic surface, these impurities can significantly alter the adhesion properties of the underlying nanotube and can cause over 30% scatter in computed interaction energies, similar in magnitude to the scatter reported in experimental measurements involving individual CNTs. Also presented is high-resolution TEM evidence that commonly used purification techniques that are effective at removing larger impurity particles from as-produced arc-discharge MWCNT samples do not remove these strongly adhered carbonaceous surface impurities.

Original languageEnglish (US)
Pages (from-to)1-11
Number of pages11
JournalCarbon
Volume80
Issue number1
DOIs
StatePublished - 2014

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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