Inhomogeneity of charge carrier concentration along the grain boundary plane in oxide superconductors

V. P. Dravid*, H. Zhang, Y. Y. Wang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Spatially resolved transmission high energy electron loss spectrometry (EELS) has been utilized to probe the spatial variation of the hole concentration along the grain boundary (GB) plane in YBa2Cu3O7-δ (Y123). The O K pre-edge peak in the EELS spectra, which offers a quantitative measure of the hole concentration in p-type doped cuprate superconductors including Y123, has been observed to vary along the GB plane. These observations conform to the Dayem-Bridge-type model for GBs in Y123. A modified Dayem-Bridge model is presented based on the experimental observations of varying oxygen stoichiometry along the GB plane.

Original languageEnglish (US)
Pages (from-to)353-358
Number of pages6
JournalPhysica C: Superconductivity and its applications
Volume213
Issue number3-4
DOIs
StatePublished - Aug 15 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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