@inproceedings{121109c80ed548e9b76aef01f76d87a3,
title = "Integrated nanoantenna labels for rapid security testing of semiconductor circuits",
abstract = "We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.",
author = "Ronen Adato and Aydan Uyar and Mahmoud Zangeneh and Boyou Zhou and Ajay Joshi and Goldberg, {Bennett B.} and {\"U}nl{\"u}, {M. Selim}",
year = "2015",
doi = "10.1364/fio.2015.fth1b.2",
language = "English (US)",
series = "Proceedings of Frontiers in Optics 2015, FIO 2015",
publisher = "OSA - The Optical Society",
booktitle = "Proceedings of Frontiers in Optics 2015, FIO 2015",
note = "Frontiers in Optics 2015, FIO 2015 ; Conference date: 18-10-2015 Through 22-10-2015",
}