TY - GEN
T1 - Integrated nanoantenna labels for rapid security testing of semiconductor circuits
AU - Adato, Ronen
AU - Uyar, Aydan
AU - Zangeneh, Mahmoud
AU - Zhou, Boyou
AU - Joshi, Ajay
AU - Goldberg, Bennett B.
AU - Ünlü, M. Selim
N1 - Publisher Copyright:
© 2015 Optical Society of America.
PY - 2015
Y1 - 2015
N2 - We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.
AB - We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.
UR - http://www.scopus.com/inward/record.url?scp=85088058354&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85088058354&partnerID=8YFLogxK
U2 - 10.1364/fio.2015.fth1b.2
DO - 10.1364/fio.2015.fth1b.2
M3 - Conference contribution
AN - SCOPUS:85088058354
T3 - Proceedings of Frontiers in Optics 2015, FIO 2015
BT - Proceedings of Frontiers in Optics 2015, FIO 2015
PB - OSA - The Optical Society
T2 - Frontiers in Optics 2015, FIO 2015
Y2 - 18 October 2015 through 22 October 2015
ER -