Integrated nanoantenna labels for rapid security testing of semiconductor circuits

Ronen Adato, Aydan Uyar, Mahmoud Zangeneh, Boyou Zhou, Ajay Joshi, Bennett B. Goldberg, M. Selim Ünlü

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.

Original languageEnglish (US)
Title of host publicationProceedings of Frontiers in Optics 2015, FIO 2015
PublisherOSA - The Optical Society
ISBN (Electronic)9781943580033
DOIs
StatePublished - 2015
Externally publishedYes
EventFrontiers in Optics 2015, FIO 2015 - San Jose, United States
Duration: Oct 18 2015Oct 22 2015

Publication series

NameProceedings of Frontiers in Optics 2015, FIO 2015

Other

OtherFrontiers in Optics 2015, FIO 2015
CountryUnited States
CitySan Jose
Period10/18/1510/22/15

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Adato, R., Uyar, A., Zangeneh, M., Zhou, B., Joshi, A., Goldberg, B. B., & Ünlü, M. S. (2015). Integrated nanoantenna labels for rapid security testing of semiconductor circuits. In Proceedings of Frontiers in Optics 2015, FIO 2015 (Proceedings of Frontiers in Optics 2015, FIO 2015). OSA - The Optical Society. https://doi.org/10.1364/fio.2015.fth1b.2