Integrated ultramicroelectrode-nanopipet probe for concurrent scanning electrochemical microscopy and scanning Ion conductance microscopy

Keyphrases

• Aluminum Oxide 14%
• Atomic Layer Deposition 14%
• Biophysical Systems 14%
• Collection Mode 14%
• Conductive Surface 14%
• Cyclic Voltammetry 14%
• Effective Radius 14%
• Electrochemical Properties 14%
• Electrophysiological Properties 14%
• Fabrication Methods 14%
• Feedback Response 14%
• Focused Ion Beam Milling 14%
• Insulating Surfaces 14%
• Microscopic Imaging 42%
• Mode Imaging 14%
• Nanopipet 100%
• Near-field Optical 14%
• Negative Feedback 14%
• Non-biological 14%
• Optical Properties 14%
• Patterned Surface 14%
• Pipet 14%
• Positive Feedback 14%
• Probe Geometry 14%
• Scanning Electrochemical Microscopy 100%
• Scanning Electron Microscopy 14%
• Scanning Ion Conductance Microscopy 100%
• Ultramicroelectrode 100%

Material Science

• Aluminum Oxide 33%
• Cyclic Voltammetry 33%
• Electrochemical Property 33%
• Focused Ion Beam 33%
• Scanning Electron Microscopy 100%
• Surface (Surface Science) 66%

Engineering

• Aluminum Oxide 25%
• Atomic Layer Deposition 25%
• Effective Radius 25%
• Focused Ion Beam 25%
• Optical Field 25%
• Powerful Tool 25%
• Scanning Electrochemical Microscopy 100%