Intensities of surface diffraction spots in plan view

P. Xu*, L. D. Marks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

Original languageEnglish (US)
Pages (from-to)155-157
Number of pages3
JournalUltramicroscopy
Volume45
Issue number1
DOIs
StatePublished - Aug 1992

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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