Intensities of surface diffraction spots in plan view

P. Xu; L. D. Marks

doi:10.1016/0304-3991(92)90046-M

Intensities of surface diffraction spots in plan view

P. Xu^*, L. D. Marks

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10^-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

Original language	English (US)
Pages (from-to)	155-157
Number of pages	3
Journal	Ultramicroscopy
Volume	45
Issue number	1
DOIs	https://doi.org/10.1016/0304-3991(92)90046-M
State	Published - Aug 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/0304-3991(92)90046-M

Cite this

@article{8e239f083f3644a9bdf95422821c06db,

title = "Intensities of surface diffraction spots in plan view",

abstract = "Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.",

author = "P. Xu and Marks, {L. D.}",

note = "Funding Information: This work is supported by the Air Force Office of Scientific Research on grant number AFOSR-90-0045.",

year = "1992",

month = aug,

doi = "10.1016/0304-3991(92)90046-M",

language = "English (US)",

volume = "45",

pages = "155--157",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Intensities of surface diffraction spots in plan view

AU - Xu, P.

AU - Marks, L. D.

N1 - Funding Information: This work is supported by the Air Force Office of Scientific Research on grant number AFOSR-90-0045.

PY - 1992/8

Y1 - 1992/8

N2 - Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

AB - Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

UR - http://www.scopus.com/inward/record.url?scp=0026911049&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026911049&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(92)90046-M

DO - 10.1016/0304-3991(92)90046-M

M3 - Article

AN - SCOPUS:0026911049

VL - 45

SP - 155

EP - 157

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 1

ER -

Intensities of surface diffraction spots in plan view

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this