Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics