Abstract
Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.
Original language | English (US) |
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Pages (from-to) | 155-157 |
Number of pages | 3 |
Journal | Ultramicroscopy |
Volume | 45 |
Issue number | 1 |
DOIs | |
State | Published - Aug 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation