Intensities of surface diffraction spots in plan view

P. Xu; L. D. Marks

doi:10.1016/0304-3991(92)90046-M

Intensities of surface diffraction spots in plan view

P. Xu^*, L. D. Marks

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10^-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

Original language	English (US)
Pages (from-to)	155-157
Number of pages	3
Journal	Ultramicroscopy
Volume	45
Issue number	1
DOIs	https://doi.org/10.1016/0304-3991(92)90046-M
State	Published - Aug 1992

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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abstract = "Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10-4 relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.",

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