TY - JOUR
T1 - Interfacial diffusion studies in Co-Pd layered films
AU - Baker, A. M.
AU - Cerezo, A.
AU - Petford-Long, A. K.
N1 - Funding Information:
Our results show the importanceo f the presenceo f grain boundarieisn polycrystallinCeo /Pd films, as these appeart o act as preferentiasli tesf or intermixingr,e ducing the thermal stability of the films. Thin (~ 5 bilayers) Co-Pd films manufacturebdy vapourd epositionin UHV conditionsa nd analysedin situ have shown good perpen-dicularm agnetica nisotropya nd a structurec ommensurate with this property.W e have also demonstratetdh at the PoSAP is an effectivem eanso f measurindgi ffusionc oef-ficientsa t temperaturebse lowt hoser eachablbey classical methods. AcknowledgemenWt:e are gratefult o the Royal Society (AC and AKPL) and to the EPSRC for financial support.
PY - 1996
Y1 - 1996
N2 - Position-sensitive atom probe microanalysis has been used to study diffusion in Co-Pd bilayers and multilayer films. Diffusion coefficients have been determined and the effect of grain boundaries on diffusion rates have been assessed.
AB - Position-sensitive atom probe microanalysis has been used to study diffusion in Co-Pd bilayers and multilayer films. Diffusion coefficients have been determined and the effect of grain boundaries on diffusion rates have been assessed.
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U2 - 10.1016/0304-8853(95)00797-0
DO - 10.1016/0304-8853(95)00797-0
M3 - Conference article
AN - SCOPUS:0030120968
SN - 0304-8853
VL - 156
SP - 83
EP - 84
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
IS - 1-3
T2 - Proceedings of the 1995 2nd International Symposium on Metallic Multilayers, MML
Y2 - 11 September 1995 through 14 September 1995