Interfacial diffusion studies in Co-Pd layered films

A. M. Baker*, A. Cerezo, A. K. Petford-Long

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations


Position-sensitive atom probe microanalysis has been used to study diffusion in Co-Pd bilayers and multilayer films. Diffusion coefficients have been determined and the effect of grain boundaries on diffusion rates have been assessed.

Original languageEnglish (US)
Pages (from-to)83-84
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
StatePublished - 1996
EventProceedings of the 1995 2nd International Symposium on Metallic Multilayers, MML - Cambridge, UK
Duration: Sep 11 1995Sep 14 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Interfacial diffusion studies in Co-Pd layered films'. Together they form a unique fingerprint.

Cite this