The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.
|Original language||English (US)|
|Number of pages||7|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|State||Published - 2008|
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering