Interfacial effects in thin films of polymeric semiconductors

Jonathan Rivnay; Leslie H. Jimison; Michael F. Toney; Michael Preiner; Nicholas A. Melosh; Alberto Salleo

doi:10.1116/1.2952454

Interfacial effects in thin films of polymeric semiconductors

Jonathan Rivnay, Leslie H. Jimison, Michael F. Toney, Michael Preiner, Nicholas A. Melosh, Alberto Salleo^*

^*Corresponding author for this work

Biomedical Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.

Original language	English (US)
Pages (from-to)	1454-1460
Number of pages	7
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	26
Issue number	4
DOIs	https://doi.org/10.1116/1.2952454
State	Published - 2008

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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@article{263a140661104fa5b6ee450dafe90e0d,

title = "Interfacial effects in thin films of polymeric semiconductors",

abstract = "The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 {\AA}) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.",

author = "Jonathan Rivnay and Jimison, {Leslie H.} and Toney, {Michael F.} and Michael Preiner and Melosh, {Nicholas A.} and Alberto Salleo",

note = "Funding Information: Portions of this research were carried out at the Stanford Synchrotron Radiation Laboratory, a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. The authors acknowledge Beng Ong and Yilian Wu of the Xerox research Centre of Canada for providing the PQT-12 material. The PQT-12 thin films were prepared while AS was at PARC. A.S. and L.H.J. gratefully acknowledge financial support from the National Science Foundation in the form of a Career Award and a Graduate Student Fellowship, respectively. J.R. gratefully acknowledges the Office of Naval Research for support through a NDSEG Fellowship.",

year = "2008",

doi = "10.1116/1.2952454",

language = "English (US)",

volume = "26",

pages = "1454--1460",

journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",

issn = "1071-1023",

number = "4",

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TY - JOUR

T1 - Interfacial effects in thin films of polymeric semiconductors

AU - Rivnay, Jonathan

AU - Jimison, Leslie H.

AU - Toney, Michael F.

AU - Preiner, Michael

AU - Melosh, Nicholas A.

AU - Salleo, Alberto

N1 - Funding Information: Portions of this research were carried out at the Stanford Synchrotron Radiation Laboratory, a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. The authors acknowledge Beng Ong and Yilian Wu of the Xerox research Centre of Canada for providing the PQT-12 material. The PQT-12 thin films were prepared while AS was at PARC. A.S. and L.H.J. gratefully acknowledge financial support from the National Science Foundation in the form of a Career Award and a Graduate Student Fellowship, respectively. J.R. gratefully acknowledges the Office of Naval Research for support through a NDSEG Fellowship.

PY - 2008

Y1 - 2008

N2 - The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.

AB - The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.

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JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

IS - 4

ER -

Interfacial effects in thin films of polymeric semiconductors

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