Abstract
The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.
Original language | English (US) |
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Pages (from-to) | 1454-1460 |
Number of pages | 7 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 26 |
Issue number | 4 |
DOIs | |
State | Published - 2008 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering