Interfacial effects in thin films of polymeric semiconductors

Jonathan Rivnay, Leslie H. Jimison, Michael F. Toney, Michael Preiner, Nicholas A. Melosh, Alberto Salleo*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.

Original languageEnglish (US)
Pages (from-to)1454-1460
Number of pages7
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume26
Issue number4
DOIs
StatePublished - 2008

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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