Abstract
The surface onto which polymeric semiconductors are cast from solution plays an important role in determining the electrical transport properties of the polymeric thin film. The authors use synchrotron-based x-ray diffraction to show that even moderate roughness (rms∼5 Å) can affect the texture of semicrystalline poly(thiophene) thin films. Moreover, the authors use a novel optical characterization technique (surface plasmon resonance spectroscopy) to characterize the appearance of electronic states in the bandgap of thin films (∼20 nm) of regioregular poly(thiophene). Such states may be due to the heterointerface between the thin Au substrate and the polymer.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1454-1460 |
| Number of pages | 7 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 26 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2008 |
Funding
Portions of this research were carried out at the Stanford Synchrotron Radiation Laboratory, a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. The authors acknowledge Beng Ong and Yilian Wu of the Xerox research Centre of Canada for providing the PQT-12 material. The PQT-12 thin films were prepared while AS was at PARC. A.S. and L.H.J. gratefully acknowledge financial support from the National Science Foundation in the form of a Career Award and a Graduate Student Fellowship, respectively. J.R. gratefully acknowledges the Office of Naval Research for support through a NDSEG Fellowship.
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering