Interfacial structure and chemistry of epitaxial CoFe2O 4 thin films on SrTiO3 and MgO substrates

S. Xie*, J. Cheng, B. W. Wessels, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

40 Scopus citations

Abstract

Interfacial structure and chemistry of epitaxial CoFe2O 4 thin films on (001)_SrTiO3 and (001)_MgO substrates were investigated using high-angle-annular-dark-field imaging combined with electron-energy-loss-spectra (EELSs) analyses at a subnanometer scale. The results show that CoFe2O4 / SrTiO3 interface is semicoherent with requisite dislocation density to accommodate ∼7% lattice mismatch, while the small (∼0.3%) lattice mismatch renders CoFe 2O4 /MgO interface coherent. EELS indicates that Fe valence is nominally +3, with no measurable change across the interfaces. Structural characterization corroborates with observed lower saturation magnetization of CoFe2O4 on MgO, which is a consequence of tensile stress built up in the 〈 100 〉 -direction negative magnetostrictive CoFe2O4.

Original languageEnglish (US)
Article number181901
JournalApplied Physics Letters
Volume93
Issue number18
DOIs
StatePublished - 2008

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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