Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter

Tyler R. Harvey*, Fehmi S. Yasin, Jordan J. Chess, Jordan S. Pierce, Roberto dos Reis, Vasfi Burak Özdöl, Peter Ercius, Jim Ciston, Wenchun Feng, Nicholas A. Kotov, Benjamin J. McMorran, Colin Ophus

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Efficient imaging of biomolecules, two-dimensional materials, and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope (STEM) using a nanofabricated diffraction grating to produce multiple probe beams. The measured phase is more interpretable than phase-contrast scanning transmission electron microscopy techniques without an off-axis reference wave, and the resolution could surpass that of off-axis electron holography. We apply this technique, called STEM holography, to image nanoparticles, carbon substrates, and electric fields. The contrast observed in experiments agrees well with contrast predicted in simulations.

Original languageEnglish (US)
Article number061001
JournalPhysical Review Applied
Volume10
Issue number6
DOIs
StatePublished - Dec 26 2018

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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