Abstract
Epitaxial magnetite (Fe3 O4) thin films were deposited by molecular beam epitaxy using molecular oxygen as the oxidant. Films deposited on (001) SrTi O3, (001) MgO, and (001) BaTi O3 surfaces are epitaxial with the film (001) parallel to the substrate (001) and the film 〈100〉 parallel to the substrate 〈100〉. X-ray magnetic circular dichroism was used to determine the relative Fe2+ Fe3+ stoichiometry of the magnetite films, which was nearly independent of oxygen partial pressure over the range studied. All films show no in-plane magnetic anisotropy. Coercive fields ranged from 0.019 to 0.039 T and depended on film roughness.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1389-1392 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 25 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2007 |
Funding
The authors acknowledge helpful discussions with Feng Niu on oxide MBE. Work at Argonne National Laboratory is supported by the U.S. Department of Energy, Office of Science and Office of Basic Energy Sciences under Contract No. DE-AC-02-06CH11357. This work was supported by the NSF under Grant Nos. DMR-0076097 and DMR-0511523. This work made use of Central Facilities supported by the MRSEC program of the National Science Foundation (DMR-0076097) at the Materials Research Center of Northwestern University.
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering