Investigation of the coupling between the outer electrodes in the superconducting double-barrier devices

I. P. Nevirkovets*, J. E. Evettes, M. G. Blamire, Z. H. Barber, E. Goldobin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

It is found experimentally that the critical current in the two-terminal double-barrier Nb/Al-AlOx-Nb/Al-AlOx-Nb device is considerably larger than the critical current in the bottom junction of the Nb/Al-AlOx-Nb/Al-AlOx-Ta/Nb device of identical planar configuration produced in the same deposition run. Our data suggest that the origin of the phenomena is a direct Josephson coupling between the external electrodes rather than the inductive interaction between the junctions.

Original languageEnglish (US)
Pages (from-to)299-304
Number of pages6
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume232
Issue number3-4
DOIs
StatePublished - Jul 28 1997
Externally publishedYes

Keywords

  • Josephson effect
  • Stacked junctions
  • Supercurrent enhancement

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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