Investigation of the piezoelectric properties of semiconducting nanostructures

Bei Peng*, Wu Ling-hua, Wen Hao-Luo Wen, Wen Hong Xu, Espinosa Horacio

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the piezoelectric properties of semiconducting nano structures have been investigated. The piezoelectric effect can be characterized via a nano-scale material testing system that utilizing microelectromechanical systems technology. The coefficients were measured by applying a voltage (field) and measuring the induced elongation (strain). It can be readily seen that the piezoelectric effects in nanostructures are generally non-linear and the coefficient is much higher than that for bulk.

Original languageEnglish (US)
Title of host publication2008 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2008
Pages390-394
Number of pages5
DOIs
StatePublished - Dec 1 2008
Event2008 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2008 - Nanjing, China
Duration: Dec 5 2008Dec 8 2008

Publication series

Name2008 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2008

Other

Other2008 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications, SPAWDA 2008
CountryChina
CityNanjing
Period12/5/0812/8/08

Keywords

  • Microeletromechanical systems
  • Nanostructures
  • Piezo
  • Semiconducting

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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