TY - JOUR
T1 - Is there an electron wind?
AU - Marks, L. D.
AU - Zhang, J. P.
N1 - Funding Information:
This work was supported by the Science and Technology Center for Superconductivity on grant no NSF/DMR-8809854 The authors would like to thank Ms R A~ for assistance with the work on ReO 3
PY - 1992/6
Y1 - 1992/6
N2 - The question of whether there is any momentum transfer to a specimen during electron diffraction, as dictated by Newton's third law, is discussed. It is pointed out that there must be momentum and energy transfer during "elastic" scattering. Even though what is normally considered as "elastic" scattering is in fact inelastic, electron density systems are insensitive to the changes in energy. Therefore the energy changes during diffraction do not prevent coherent interference phenomena such as electron holography and high-resolution electron microscopy. The momentum transfer, in effect, introduces an electron wind which can, mechanically, alter the specimen; the wind is equivalent to a storm with gusts of up to 300 km/h. Experimental evidence in support of this is presented.
AB - The question of whether there is any momentum transfer to a specimen during electron diffraction, as dictated by Newton's third law, is discussed. It is pointed out that there must be momentum and energy transfer during "elastic" scattering. Even though what is normally considered as "elastic" scattering is in fact inelastic, electron density systems are insensitive to the changes in energy. Therefore the energy changes during diffraction do not prevent coherent interference phenomena such as electron holography and high-resolution electron microscopy. The momentum transfer, in effect, introduces an electron wind which can, mechanically, alter the specimen; the wind is equivalent to a storm with gusts of up to 300 km/h. Experimental evidence in support of this is presented.
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U2 - 10.1016/0304-3991(92)90221-5
DO - 10.1016/0304-3991(92)90221-5
M3 - Article
AN - SCOPUS:0026680912
VL - 41
SP - 419
EP - 422
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
IS - 4
ER -