Is there any beam yet? Uses of synchrotron radiation in the in situ study of electrochemical interfaces

H. D. Abruna*, J. H. White, M. J. Albarelli, G. M. Bommarito, M. J. Bedzyk, M. McMillan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

The advantages of employing synchrotron radiation for the in situ study of electrochemical interfaces are discussed with emphasis on the techniques of surface EXAFS (extended X-ray absorption fine structure) and X-ray standing waves. The principles behind the techniques are briefly considered followed by a discussion of recent experimental results. Examples include the study of underpotentially deposited metallic monolayers, polymer films on electrodes, and in situ measurement of adsorption isotherms. We conclude with an assessment of future directions.

Original languageEnglish (US)
Pages (from-to)7045-7052
Number of pages8
JournalJournal of physical chemistry
Volume92
Issue number25
DOIs
StatePublished - 1988

ASJC Scopus subject areas

  • Engineering(all)
  • Physical and Theoretical Chemistry

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