Abstract
The advantages of employing synchrotron radiation for the in situ study of electrochemical interfaces are discussed with emphasis on the techniques of surface EXAFS (extended X-ray absorption fine structure) and X-ray standing waves. The principles behind the techniques are briefly considered followed by a discussion of recent experimental results. Examples include the study of underpotentially deposited metallic monolayers, polymer films on electrodes, and in situ measurement of adsorption isotherms. We conclude with an assessment of future directions.
Original language | English (US) |
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Pages (from-to) | 7045-7052 |
Number of pages | 8 |
Journal | Journal of physical chemistry |
Volume | 92 |
Issue number | 25 |
DOIs | |
State | Published - 1988 |
ASJC Scopus subject areas
- Engineering(all)
- Physical and Theoretical Chemistry