Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling

Irene Y.T. Chang; Derk Joester

doi:10.1017/S143192761501510X

Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling

Irene Y.T. Chang, Derk Joester^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article

2 Scopus citations

Abstract

On account of its excellent resolution and high throughput, cryoSEM imaging has recently seen resurgence. In this work, we report on the development of cryogenic triple ion gun milling (CryoTIGM^™), a broad ion beam milling technique for cryo-planing of vitrified, frozen-hydrated specimens. We find that sections prepared with CryoTIGM^™ are smooth over exceptionally large areas (∼700,000 μm²), and reveal ultrastructural details in similar or better quality than freeze-fractured samples.

Original language	English (US)
Pages (from-to)	1616-1621
Number of pages	6
Journal	Microscopy and Microanalysis
Volume	21
Issue number	6
DOIs	https://doi.org/10.1017/S143192761501510X
State	Published - Oct 12 2015

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Keywords

cryo-planning
cryoSEM
freeze fracture
high pressure freezing
ultrastructure

ASJC Scopus subject areas

Instrumentation

Cite this

Chang, I. Y. T., & Joester, D. (2015). Large Area Cryo-Planing of Vitrified Samples Using Broad-Beam Ion Milling. Microscopy and Microanalysis, 21(6), 1616-1621. https://doi.org/10.1017/S143192761501510X

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Access to Document

10.1017/S143192761501510X