Lattice- vs. grain-boundary-controlled interdiffusion in Bi-Sb bilayer films

T. Missana*, C. N. Afonso, A. K. Petford-Long, R. C. Doole

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Bi and Sb were deposited in a bilayer configuration with either Bi or Sb as the underlying layer. The morphology and structure of these films were very different depending on the deposition order. The films were annealed during in situ observation in a transmission electron microscope in order to study the changes caused by interdiffusion. Grain-boundary-or lattice-controlled interdiffusion processes were observed depending on the initial film microstructure.

Original languageEnglish (US)
Pages (from-to)186-192
Number of pages7
JournalThin Solid Films
Volume288
Issue number1-2
DOIs
StatePublished - Nov 15 1996

Keywords

  • Annealing
  • Antimony
  • Bismuth
  • Diffusion

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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